Investigation of the field dependance of the injection of positive charges into the SiO₂ at the Si-SiO₂ interface

Author: 
Dominik Brüske
Date: 
Oct 2014

Thesis Type:

The work of this bachelor thesis led to the following publications:

D. Brueske et al., "Investigation of the insulator layers for segmented silicon sensors before and after X-ray irradiation,”
2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), Seattle, WA, 2014, pp. 1-5.
doi: 10.1109/NSSMIC.2014.7431261

Research Activities: